文章來(lái)源 : 廣東優(yōu)科檢測(cè) 發(fā)表時(shí)間：2022-11-29 瀏覽數(shù)量：
AEC-Q200是車規(guī)無(wú)源器件應(yīng)力測(cè)試標(biāo)準(zhǔn)，AEC-Q200認(rèn)證是被動(dòng)元件汽車級(jí)品質(zhì)認(rèn)證，被動(dòng)元器件廠家要進(jìn)入汽車領(lǐng)域，必須要通過(guò)AECQ200測(cè)試。廣東優(yōu)科檢測(cè)是專業(yè)第三方AEC-Q200認(rèn)證測(cè)試機(jī)構(gòu)，接下來(lái)為大家介紹AECQ200測(cè)試項(xiàng)目。
AEC-Q200 REV D標(biāo)準(zhǔn)TABLE 1定義了AECQ200的所有測(cè)試項(xiàng)目及樣品數(shù)量要求，TABLE 2 - TABLE 14分別針對(duì)不同的產(chǎn)品定義了測(cè)試項(xiàng)目及測(cè)試要求。
| TABLE 1 - QUALIFICATION SAMPLE SIZE REQUIREMENTS 表1-認(rèn)證測(cè)試樣品數(shù)量要求 | |||||
| Stress 應(yīng)力方式 | NO. | Note 注釋 | Sample Size Per Lot 樣品數(shù)/批 | Number of lots 批次 | Accept on Number failed 接受標(biāo)準(zhǔn) |
| Pre-and Post-Stress Electrical Test 應(yīng)力測(cè)試前后電氣測(cè)試 | 1 | G | All qualification parts submitted for testing | 0 | |
| High Temperature Exposure 高溫存儲(chǔ) | 3 | DG | 77 Note B | 1 | 0 |
| Temperature Cycling 溫度循環(huán) | 4 | DG | 77 Note B | 1 | 0 |
| Destructive Physical Analysis 破壞性物理分析 | 5 | DG | 10 Note B | 1 | 0 |
| Moisture Resistance 濕度抵抗 | 6 | DG | 77 Note B | 1 | 0 |
| Humidity Bias 偏高濕度 | 7 | DG | 77 Note B | 1 | 0 |
| High Temperature Operating Life 高溫工作壽命 | 8 | DG | 77 Note B | 1 | 0 |
| External Visual 外觀 | 9 | NG | All qualification parts submitted 所有提交認(rèn)證的產(chǎn)品 | 0 | |
| Physical Dimensions 尺寸 | 10 | NG | 30 | 1 | 0 |
| Terminal Strength 端子強(qiáng)度 | 11 | DGL | 30 | 1 | 0 |
| Resistance to Solvent 溶劑抵抗 | 12 | DG | 5 | 1 | 0 |
| Mechanical Shock 機(jī)械沖擊 | 13 | DG | 30 Note B | 1 | 0 |
| Vibration 振動(dòng) | 14 | DG | |||
| Resistance to Solder Heat 抗焊接熱 | 15 | DG | 30 | 1 | 0 |
| Thermal Shock 熱沖擊 | 16 | DG | 30 | 1 | 0 |
| ESD 靜電放電 | 17 | D | 15 | 1 | 0 |
| Solderability 可焊性 | 18 | D | 15 each condition 每種條件 | 1 | 0 |
| Electrical Characterization 電氣特性 | 19 | NG | 30 Note A 注意事項(xiàng)A | 3 | 0 |
| Flammability 可燃性 | 20 | D | Present certificate of compliance 提供合格證明書(shū) | ||
| Board Flex 板彎曲 | 21 | DS | 30 | 1 | 0 |
| Terminal Strength (SMD) 端子強(qiáng)度（表面貼裝元件） | 22 | DS | 30 | 1 | 0 |
| Beam Load 射束負(fù)載（斷裂強(qiáng)度） | 23 | DG | 30 | 1 | 0 |
| Flame Retardance 阻燃測(cè)試 | 24 | DG | 30 | 1 | 0 |
| Rotation Life 旋轉(zhuǎn)壽命 | 25 | DG | 30 | 1 | 0 |
| Surge Voltage 浪涌電壓 | 27 | DG | 30 | 1 | 0 |
| Salt Spray 鹽霧測(cè)試 | 29 | DG | 30 | 1 | 0 |
| Electrical Transient Conduction 瞬時(shí)電傳導(dǎo) | 30 | DG | 30 | 1 | 0 |
| Shear Strength 剪切強(qiáng)度 | 31 | DG | 30 | 1 | 0 |
| Short Circuit Fault Current Durability 短路失效電流持久性 | 32 | DG | 30 | 1 | 0 |
| Fault Current Durability 失效電流持久性 | 33 | DG | 30 | 1 | 0 |
| End-of-Life Mode Verification 壽命終止模式驗(yàn)證 | 34 | DG | 30 | 1 | 0 |
| Jump Start Endurance 助推啟動(dòng)持久性 | 35 | DG | 30 | 1 | 0 |
| Load Dump Endurance 突缷負(fù)荷持久性 | 36 | DG | 30 | 1 | 0 |
LEGEND FOR TABLE 1 表1說(shuō)明
Note:
A For parametric verification data, sometimes circumstances may neccessitate the acceptance of only one lot by the user. Should a subsequent user decide to use a previous user's qualification approval, it will be the subsequent user's responsibility to verify an acceptable number of lots were used.
對(duì)于參數(shù)驗(yàn)證數(shù)據(jù)，有時(shí)情況可能需要用戶僅接受一個(gè)批次。如果后續(xù)用戶決定使用先前用戶的資格認(rèn)證，則后續(xù)用戶將負(fù)責(zé)驗(yàn)證使用的批次數(shù)量是否可接受。
B Where generic (family) data is provided in lieu of component specific data, 3 lots are required.
如果提供通用（系列）數(shù)據(jù)代替部件特定數(shù)據(jù)，則需要3批。
H Required for hermetic packaged devices only.
僅適用于密封包裝設(shè)備。
L Required for leaded devices only.
僅限含鉛設(shè)備。
N Nondestructive test, devices can be used to populate other tests or they can be used for production.
無(wú)損檢測(cè)，設(shè)備可用于填充其他測(cè)試或用于生產(chǎn)。
D Destructive test, devices are not to be reused for qualification or production.
破壞性試驗(yàn)，設(shè)備不得重復(fù)用于鑒定或生產(chǎn)。
S Required for surface mount devices only.
僅適用于表面安裝設(shè)備。
G Generic data allowed. See Section 2.3.
允許通用數(shù)據(jù)。見(jiàn)第2.3節(jié)。
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